Features:
- All-in-one BER and Eye Pattern Measurements
- High-speed Remote Tests
- Supports Electrical and Optical Interfaces
- High-speed Mask Tests
- Easy Operability, Flash Disk Drive, and Eco-friendly
- All-in-one unit supporting simultaneous Jitter, Eye Pattern and Eye Mask measurements
- Supports all WDP measurements
- Simultaneous sampling and ideal Equalizer/Emphasis value calculation with Eye display
- Simultaneous Eye Pattern, Eye Mask and Jitter Measurements for simulation waveform
The MP2100A is an all-in-one BERT and EYE/Pulse Scope solution for evaluating optical active devices in optical communication systems.
To meet the need for the fastest possible measurement speeds on production lines for active optical devices, the Gating Time has been slashed by 90% compared to conventional BERT equipment using remote commands and the EYE/Pulse Scope function is 300% faster. In addition, measurement times are much shorter due to the simultaneous BER measurement and EYE pattern analysis.
The MX210001A Jitter Analysis Software has a new, high-speed, jitter-measurement function supporting all-in-one measurements, such as simultaneous jitter analysis, and Eye pattern measurement and Eye mask test measurements. Moreover, the high-speed sampling increases measurement efficiency by cutting measurement time. And Combining the MX210001A with MATLAB supports WDP, TWDP and dWDP measurements for evaluating the waveform dispersion of specific signals.
Adding the MX210002A Transmission Analysis Software to the BERTWave supports Tx analyses (S21 Gain, Phase), and waveform simulation (de-embedded) using linear equalizer, filter, and emphasis operations; simultaneous waveform sampling and simulation support simultaneous Eye pattern measurement and Eye mask test measurements. Furthermore, combined tracking with the MX210001A software permits simultaneous post-simulation waveform jitter measurement.
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BERTS
| Operation bit rate | With MP2100A/MP2101A-090 | Without MP2100A/MP2101A-090 |
| PPG, ED Common; 1/N bit-rate operation range | PPG; 1/N bit-rate operation range ED; | |
| Test Pattern | PRBS: 27-1, 29-1, 215-1, 223-1, 231-1, (Invert ON/OFF), USER Data: 1.3 Mbit programmable (sample pattern file such as CJPAT and so on) | |
| Electrical Data Output | Data, Xdata | |
| Amplitude | 0.1 Vp-p to 0.8 Vp-p | |
| Electrical Data Input | Data, Xdata (Option 001), Data (Option 003) | |
| Amplitude | 0.1 Vp-p to 0.8 Vp-p | |
| O/E Input (Option 003) | Optical Data | |
| Wavelength Range | 750 nm to 1650 nm | |
| XFP Slot (Option 050) | XFP Slot | |
| SFP+ Slot (Option 051) | SFP+ Slot | |
EYE/Pulse Scope
| Bandwidth (-3 dB) | DC to 20 GHz minimum, DC to 25 GHz Typical |
| Display | Eye Pattern, Pulse Pattern |
| Measurement Function | Statistical (NRZ), Histogram, Mask Compliance |
| Sampling Speed | 100 K samples/sec, Typical |
| O/E Input (Option 003) | Optical Data |
| Wavelength Range | 750 nm to 1650 nm |
| Clock Recovery (Option 055) | 0.1 GHz to 2.7 GHz, 8.5 GHz to 12.5 GHz |
MX210001A Jitter Analysis Software
| Operating Conditions | Operates only when installed in MP2100A/MP2102A with correct license information The installer runs with V3.00.00 or later Other use conditions comply with MP2100A series The WDP runs under MATLAB R2010b SP1 |
| Measurement Algorithm | Histogram mode, Pattern Search mode |
| Histogram mode | |
| Measurement Items | TJ (1.0E-12), TJ (user defined), RJ (d-d), DJ (d-d), DDPWS, J2 jitter analysis, J9 jitter analysis, Eye opening |
| Pattern Search mode | |
| Measurement Items | TJ (1.0e-12), TJ (user defined), RJ (d-d), RJ (rms), DJ (d-d), PJ (p-p), DDJ (p-p), DCD, ISI (p-p), Eye opening, J2 jitter analysis, J9 jitter analysis, DDPWS, PJ Frequency |
| WDP Measurement | Requires installation of MATLAB 2010b by MathWorks |
| Measurement Items | WDP, dWDP, TWDP, dTWDP, WDPc, dWDPc, TWDPc, dWDPc |
MX210002A Transmission Analysis Software
| Operating Conditions | Operates only when installed in MP2100A with correct license information The installer runs with V3.00.00 or later Other use conditions comply with MP2100A series |
| Measurement Mode | Transmission analysis, Waveform estimation |
| Transmission Analysis | |
| Measurement Items | Gain graph, Phase graph, Group delay graph (Phase graph and Group delay graph switching display) |
| Waveform Estimation | |
| Equalizer Setting | Selects reflector, non-reflector at calculation |
| Emphasis Format | 2Post/1Pre, 3Post, 1Post/1Pre, 2Post, 1Post |
| Device Character | Reads S2P File |
| Jitter Analysis | Displays estimated waveform calculation results at MX210001A (when MX210001A installed in MP2100A) |
---Cuts Measurement Times---
All-in-one BER and Eye Pattern Measurements
High-speed Remote Tests
High-speed Mask Tests
High-speed sampling supports fast mask tests in about 12 s*, cutting measurement times.
(*) Typical value when capturing 1 x 106 samples at bit rate of 10.3125 Gbit/s with PRBS31 test pattern, back-to-back
High-speed Mask Margin Tests
---Various Measurement Functions---
Wide Operation Frequency Range
Signal Integrity Analysis
The EYE/Pulse Scope supporting DC to 25 ＧＨz offers signal integrity analysis using a variety of applications.
■Time and Amplifier Tests
■Histogram
Measuring averages, standard deviation and scatter of data in a specified area supports waveform data component analysis and troubleshooting.
---High-accuracy Extinction Ratio Measurements---
Supports High-accuracy Extinction Ratio Measurements
■Excellent Bessel Filters
Bessel filters with the excellent frequency characteristics support high-accuracy extinction ratio measurement results.
---Jitter Analysis Function---
MX210001A Jitter Analysis Software
The ideal jitter analysis solution matching the application can be selected from either the histogram mode for measuring basic jitter analysis or the pattern search mode for detailed jitter analysis.
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---Transmission Analysis Function---
MX210002A Transmission Analysis Software
Waveform simulation with transmission analysis (S21 Gain, Phase) functions as well as linearity, filtering and emphasis calculation supports simultaneous waveform sampling and simulation. The Eye pattern measurement and Eye mask test functions can also be used simultaneously.
■Simultaneous TRx Measurements
One MP2100A supports both electrical and optical interfaces for performing simultaneous TRx evaluations of optical modules, cutting measurement times.
■High-speed Remote Tests
The built-in remote high-speed mode supports mixed remote functions for batch processing multiple commands and cuts BER measurement times by 30% to 10 ms.
■High-speed Mask Tests
High-speed sampling supports fast mask tests in about 12 s*, cutting measurement times.
(*) Typical value when capturing 1 x 106 samples at bit rate of 10.3125 Gbit/s with PRBS31 test pattern, back-to-back
Active Optical Cable Evaluation
■Simultaneous 2-channel BER Measurements
Expansion of the BERTS to 2 channels supports easy simultaneous TRx measurements and crosstalk tests.
■All-in-one BER and Eye Pattern Measurements
Simultaneous BER measurements and eye-pattern analysis using an all-in-one tester does not require a separate BERTS and sampling scope, halving equipment costs.
■Wide Operation Frequency Range
The BERT function supports bit rate from 125 Mbit/s to 12.5 Gbit/s (with Option-090) for evaluating devices and application supporting 100BASE-FX, GE-PON, CPRI, 10GFC, OUT-2 and etc.
Physical Layer Evaluation for Transmission Equipment
■Clock Recovery
The EYE/Pulse pattern Clock recovery function (Option-055) supports rates of 8.5 to 12.5 GHz and 0.1 to 2.7 GHz to perform mask tests for most applications.
■High-speed Mask Tests
High-speed sampling supports fast mask tests in about 12 s*, cutting measurement times.
(*) Typical value when capturing 1 x 106 samples at bit rate of 10.3125 Gbit/s with PRBS31 test pattern, back-to-back
Active Optical Cable (AOC) Measurements
The MX210001A supports simultaneous jitter analysis, Eye pattern measurement, and Eye mask tests required by high-speed and multi-lane Active Optical Cables (AOC). Moreover, high-speed triggering supports fast DDJ measurements, reducing measurement times by 80%.
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Direct Attach Cable (DAC) Measurements
The Eye opening of passive cables like Direct Attach Cables (DAC) used for short connections between server racks, etc., can be assured using the equalizer built into the equipment Rx section. The MX210002A can be used to measure S21 Gain, Phase) characteristics of these devices. Moreover, since waveforms with optimized equalizer, filter, and emphasis values can be predicted from these transmission characteristics, Eye pattern measurement and Eye mask test of simulated waveforms can be performed.
In addition, combination with the MX210001A supports tests required for DAC manufacturing, such as Eye pattern measurement and jitter analysis, in one unit.
Emphasis Effect Simulation
The same 4-tap emphasis as the MP1825B 4 Tap Emphasis can be set. The type of Eye pattern measurement resulting from equalization and emphasis correction of a waveform with an Eye pattern measurement degraded by transmission path loss, or analysis using on-the-spot waveform simulation to determine the required equalization or emphasis can be fed back into the emphasis design.
MP2100A BERTWave
The MP2100A BERTWave is the all-in-one BERT and Eye/Pulse Scope measurement solution. Simultaneous BER measurement and Eye-pattern analysis cuts measurement times by eliminating time-consuming setup. The MP2100A series is the ideal all-in-one solution supporting both R&D and manufacturing.
MP2101A BERTWave PE
The MP2101A BERTWave PE is the solution just for BER measurements. Expanding the BERTWave PE to 2 channels supports easy, efficient, simultaneous TRx measurements by eliminating complex line changes. Moreover, all-in-one support for PPG/ED crosstalk tests cuts measurement times and setup costs.
MP2102A BERTWave SS
The MP2102A BERTWave SS is the ideal solution just for high-speed EYE pattern analysis using the built-in clock recovery function which supports evaluation of the optical characteristics of long-distance transmission equipment and devices with no clock output. Built-in time/amplitude test, histogram analysis, and mask/mask margin test functions make it the perfect solution for signal quality analyses.
Software
-Jitter Analysis Software-
The MX210001A Jitter Analysis Software has a new, high-speed, jitter-measurement function supporting all-in-one measurements, such as simultaneous jitter analysis, and Eye pattern measurement and Eye mask test measurements.
Moreover, the high-speed sampling increases measurement efficiency by cutting measurement time. And Combining the MX210001A with MATLAB supports WDP, TWDP and dWDP measurements for evaluating the waveform dispersion of specific signals.
-Transmission Analysis Software-
MX210002A Transmission Analysis Software to the BERTWave supports Tx analyses (S21 Gain, Phase), and waveform simulation (de-embedded) using linear equalizer, filter, and emphasis operations; simultaneous waveform sampling and simulation support simultaneous Eye pattern measurement and Eye mask test measurements. Furthermore, combined tracking with the MX210001A software permits simultaneous post-simulation waveform jitter measurement.